talos IC test handler: active thermal control (ATC) option

key features

temperature range of -60 °C to +175 °C (-76 °F to +345 °F)
fully integrated, handler-software-controlled cooling unit offering three configuration options –
- electrical air chiller:
  -40 °C (-40 °F) DUT junction temperature system specification
- dual electrical air chiller:
  -50 °C (-58 °F) DUT junction temperature system specification
- LN2 heat exchanger:
  -60 °C (-76 °F) DUT junction temperature system specification
optional plunger microchamber providing additional performance of up to 10 °C (50 °F)
closed loop temperature control – sensor integrated in temperature head
highest accuracy due to direct temperature measurement at heatsink, in conductive contact with device
high IC power dissipation controllable during electrical test
software-operated air flow control system with HMI feedback included
changing set temperature of tester via GPIB or RS232 –
- fine adjustment during testing possible
- single-insertion at multiple test temperatures possible
- multiple tests at different set temperatures without user interaction possible
system interior sealed and purged to prevent icing
modular, expandable temperature system

IC Handler temperature controlactive thermal control (ATC) option