esmo docking and interfaces solutions for semicon test

Docking (both hard docking and direct docking) is required between the test head and device handler or wafer prober.

During ATE test process, a stable mechanical interface between test head and wafer prober quite important. Customer face challenge: frequent test docking task, high accuracy, new tester and prober combination, displacement…… so they need a stable interface for their tester and prober combination.

esmo group has over 20 years of designing and manufacturing prober or tester docking and mechanical interfaces experience. All esmo semicon docking and interfaces products are available with standardized features for integration in any conventional handler, prober, and tester types.

High docking force and repeatable accuracy, modular/robust design, esmo precision designs improve accuracy and integrity of test results. esmo docking and interfaces products set up quickly, virtually maintenance free, increased test yields.